Contributor: Marcus Griffiths (University of Nottingham)
Not print optimized model
File type: STL
Licence: CC Attribution
Overview
10-day-old wheat seedling root system grown and scanned in a sandy loam sand mixture at a resolution of 54µM per voxel using a Phoenix v|tome|x m micro CT scanner at the Hounsfield Facility. X-ray attenuation of the roots is usually consistent, but variability between stacks may be caused by differences in the soil surrounding the roots, such as soil texture, organic matter content, moisture content etc.
In action photo
